Labotronics Transmission Electron Microscope provides 20x to 1.5Mx magnification and a 0.2 nm information limit for material characterization. Materials Science Microscope combines a double-tilt sample holder with a motorized 5-axis goniometer to position specimens for structural examination. Manufactured for materials science and industrial research, it supports crystal defect analysis and nanostructure studies with CMOS image capture.